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      Effect of sample locations on computation of the exact scalar diffraction field (in English)

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      Author
      Esmer, G. B.
      Özaktaş, Haldun M.
      Onural, Levent
      Date
      2012
      Source Title
      2012 20th Signal Processing and Communications Applications Conference (SIU)
      Print ISSN
      2165-0608
      Publisher
      IEEE
      Language
      English
       
      Turkish
       
      Type
      Conference Paper
      Item Usage Stats
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      Abstract
      Computer generated holography is one of common methods to obtain three-dimensional visualization. It can be explained by behavior of propagating waves and interference. To calculate the scalar diffraction pattern on a hologram, there are myriad of algorithms in the literature. Some of them employ several approximations, so the calculated fields may not be the exact scalar diffraction field. However, there are algorithms to compute the exact scalar diffraction field with some limitations on the distribution of the given samples over the space. These algorithms are based on "field model" approach. The performance of an algorithm, based on field model, is investigated according to the distribution of given samples over the space. From the simulations, it was observed that the cumulative information provided by the given samples has to be enough to solve the inverse scalar diffraction field. The cumulative information can be increased by having more samples, but there are some scenarios that differential information obtained from the given samples can be infinitesimal, thus the exact diffraction field may not be computed. © 2012 IEEE.
      Keywords
      Differential information
      Diffraction fields
      Field model
      Sample location
      Scalar diffraction
      Three dimensional visualization
      Algorithms
      Computer generated holography
      Signal processing
      Three dimensional computer graphics
      Visualization
      Diffraction
      Permalink
      http://hdl.handle.net/11693/28180
      Published Version (Please cite this version)
      http://dx.doi.org/10.1109/SIU.2012.6204493
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      • Department of Electrical and Electronics Engineering 3524
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