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      • Department of Electrical and Electronics Engineering
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      Influence function based Gaussianity tests for detection of microcalcifications in mammogram images

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      Author
      Gürcan, M. Nafi
      Yardımcı, Y.
      Çetin, A. Enis
      Date
      1999-10
      Source Title
      Proceedings 1999 International Conference on Image Processing
      Publisher
      IEEE
      Pages
      407 - 411
      Language
      English
      Type
      Conference Paper
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      Abstract
      In this paper, computer-aided diagnosis of microcalcifications in mammogram images is considered. Microcalcification clusters are an early sign of breast cancer. Microcalcifications appear as single bright spots in mammogram images. We propose an effective method for the detection of these abnormalities. The first step of this method is two-dimensional adaptive filtering. The filtering produces an error image which is divided into overlapping square regions. In each square region, a Gaussianity test is applied. Since microcalcifications have an impulsive appearance, they are treated as outliers. In regions with no microcalcifications, the distribution of the error image is almost Gaussian, on the other hand, in regions containing microcalcification clusters, the distribution deviates from Gaussianity. Using the theory of the influence function and sensitivity curves, we develop a Gaussianity test. Microcalcification clusters are detected using the Gaussianity test. Computer simulation studies are presented.
      Keywords
      Calcification (biochemistry)
      Computer aided analysis
      Computer aided diagnosis
      Computer simulation
      Error analysis
      Functions
      Image analysis
      Oncology
      Sensitivity analysis
      Signal filtering and prediction
      Gaussianity tests
      Microcalcification
      Mammography
      Permalink
      http://hdl.handle.net/11693/27845
      Published Version (Please cite this version)
      https://doi.org/10.1109/ICIP.1999.817145
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      • Department of Electrical and Electronics Engineering 3614
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