Show simple item record

dc.contributor.authorAtalar, Abdullahen_US
dc.contributor.authorKoymen, H.en_US
dc.contributor.authorDegertekin, L.en_US
dc.date.accessioned2016-02-08T12:02:30Z
dc.date.available2016-02-08T12:02:30Z
dc.date.issued1990en_US
dc.identifier.issn0090-5607
dc.identifier.urihttp://hdl.handle.net/11693/27828
dc.description.abstractThe Lamb wave lens is a type of lens that can replace the conventional lens of an acoustic microscope for some applications. When it insonifies a layered solid structure, it excites a single mode in the structure, provided that the frequency is properly adjusted. Measuring the return signal as a function of frequency results in a characteristic curve showing the excited modes. Since the number of excited modes, the frequencies at which they are excited, and the efficiency of excitation are highly dependent on the elastic and physical parameters of the layered solid, a characterization method emerges. The authors describe this characterization method for the layered structures using the Lamb wave lens. Theoretical and experimental results are presented.en_US
dc.language.isoEnglishen_US
dc.source.titleUltrasonics Symposium Proceedingsen_US
dc.relation.isversionofhttps://doi.org/10.1109/ULTSYM.1990.171386en_US
dc.subjectLensesen_US
dc.subjectUltrasonic Wavesen_US
dc.subjectLamb wave lensesen_US
dc.subjectLamb wavesen_US
dc.subjectLayered materialsen_US
dc.subjectMicroscopes, Acousticen_US
dc.titleCharacterization of layered materials by the Lamb wave lensen_US
dc.typeConference Paperen_US
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.citation.spage359en_US
dc.citation.epage362en_US
dc.citation.volumeNumber1en_US
dc.identifier.doi10.1109/ULTSYM.1990.171386en_US
dc.publisherIEEEen_US


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record