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dc.contributor.authorDikmen, C. T.en_US
dc.contributor.authorAlaybeyi, M. M.en_US
dc.contributor.authorTopcu, Satılmışen_US
dc.contributor.authorAtalar, Abdullahen_US
dc.contributor.authorSezer, E.en_US
dc.contributor.authorTan, Mehmet Alien_US
dc.contributor.authorRohrer, R. A.en_US
dc.coverage.spatialSingapore, Singapore
dc.date.accessioned2016-02-08T12:02:23Z
dc.date.available2016-02-08T12:02:23Z
dc.date.issued1991-06en_US
dc.identifier.issn0271-4310
dc.identifier.urihttp://hdl.handle.net/11693/27819
dc.descriptionDate of Conference: 11-14 June 1991
dc.descriptionConference name: 1991 IEEE International Sympoisum on Circuits and Systems
dc.description.abstractA general purpose circuit simulation program, PL-AWE (piecewise linear asymptotic waveform evaluator) is developed especially for the analysis of VLSI circuits. PL-AWE uses the asymptotic waveform evaluation (AWE) technique, which is a new method to analyze linear(ized) circuits, and piecewise-linear (PL) models to represent nonlinear elements. AWE employs a form of Padeapproximation rather than numerical integration to approximate the behavior of linear(ized) circuits in either the time or the frequency domain. The authors discuss the internal workings of the program, and indicate its effectiveness in terms of several illustrative examples.en_US
dc.language.isoEnglishen_US
dc.source.titleProceedings - IEEE International Symposium on Circuits and Systemsen_US
dc.relation.isversionofhttps://doi.org/10.1109/ISCAS.1991.176497en_US
dc.subjectComputer Simulationen_US
dc.subjectMathematical Techniques--Approximation Theoryen_US
dc.subjectMathematical Techniques--Nonlinear Equationsen_US
dc.subjectWaveform Analysisen_US
dc.subjectAsymptotic Waveform Evaluationen_US
dc.subjectPiecewise Linear Modelsen_US
dc.subjectIntegrated Circuits, VLSIen_US
dc.titlePiecewise linear asymptotic waveform evaluation for transient simulation of electronic circuitsen_US
dc.typeConference Paperen_US
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.citation.spage854en_US
dc.citation.epage857en_US
dc.identifier.doi10.1109/ISCAS.1991.176497en_US
dc.publisherIEEEen_US


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