Reflection properties and defect formation in metallic photonic crystals
Please cite this item using this persistent URLhttp://hdl.handle.net/11693/27681
Technical Digest - European Quantum Electronics Conference
- Conference Paper 
IEEE, Piscataway, NJ, United States
The reflection properties of layer-by-layer metallic photonic crystals were investigated using metallic photonic crystals with simple-tetragonal (st) structure. The observed properties were used to predict defect formation in these crystals. The reflection and transmission amplitude characteristics were measured by a network analyzer and standard gain horn antennas. Transformation matrix method was employed for the theoretical simulations.