Reflection properties and defect formation in metallic photonic crystals
Technical Digest - Summaries of Papers Presented at the International Quantum Electronics Conference - Conference Edition, 1998
81 - 82
Item Usage Stats
The reflection properties of layer-by-layer metallic photonic crystals were investigated using metallic photonic crystals with simple-tetragonal (st) structure. The observed properties were used to predict defect formation in these crystals. The reflection and transmission amplitude characteristics were measured by a network analyzer and standard gain horn antennas. Transformation matrix method was employed for the theoretical simulations.
Transformation matrix method