Reflection properties and defect formation in metallic photonic crystals
Soukoulis, C. M.
Ho, K. M.
Technical Digest - European Quantum Electronics Conference
IEEE, Piscataway, NJ, United States
81 - 82
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The reflection properties of layer-by-layer metallic photonic crystals were investigated using metallic photonic crystals with simple-tetragonal (st) structure. The observed properties were used to predict defect formation in these crystals. The reflection and transmission amplitude characteristics were measured by a network analyzer and standard gain horn antennas. Transformation matrix method was employed for the theoretical simulations.
Transformation matrix method