Simultaneous non-contact atomic force microscopy (nc-AFM)/STM imaging and force spectroscopy of Si(1 0 0)(2 × 1) with small oscillation amplitudes
Date
2002Source Title
Applied Surface Science
Print ISSN
0169-4332
Publisher
Elsevier Science B.V.
Volume
188
Issue
3-4
Pages
301 - 305
Language
English
Type
ArticleItem Usage Stats
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Abstract
Si(1 0 0)(2 × 1) surface is imaged using a new non-contact atomic force microscopy (nc-AFM)/STM with sub-Ångström oscillation amplitudes using stiff tungsten levers. Simultaneous force gradient and STM images of individual dimers and atomic scale defects are obtained. We measured force-distance (f-d) curves with different tips. Some of the tips show long force interactions, whereas some others resolve short-range interatomic force interactions. We observed that the tips showing short-range force interaction give atomic resolution in force gradient scans. This result suggests that short-range force interactions are responsible for atomic resolution in nc-AFM.
Keywords
Force-distance spectroscopyNon-contact atomic force microscopy
Short-range forces
Si(1 0 0)(2 × 1)
Small oscillation amplitudes
Atomic force microscopy
Imaging techniques
Oscillations
Scanning tunneling microscopy
Surfaces
Oscillation amplitudes
Semiconducting silicon