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      Simultaneous non-contact atomic force microscopy (nc-AFM)/STM imaging and force spectroscopy of Si(1 0 0)(2 × 1) with small oscillation amplitudes

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      Author(s)
      Özer, H. Ö.
      Atabak, M.
      Ellialtoğlu, R. M.
      Oral, A.
      Date
      2002
      Source Title
      Applied Surface Science
      Print ISSN
      0169-4332
      Publisher
      Elsevier Science B.V.
      Volume
      188
      Issue
      3-4
      Pages
      301 - 305
      Language
      English
      Type
      Article
      Item Usage Stats
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      Abstract
      Si(1 0 0)(2 × 1) surface is imaged using a new non-contact atomic force microscopy (nc-AFM)/STM with sub-Ångström oscillation amplitudes using stiff tungsten levers. Simultaneous force gradient and STM images of individual dimers and atomic scale defects are obtained. We measured force-distance (f-d) curves with different tips. Some of the tips show long force interactions, whereas some others resolve short-range interatomic force interactions. We observed that the tips showing short-range force interaction give atomic resolution in force gradient scans. This result suggests that short-range force interactions are responsible for atomic resolution in nc-AFM.
      Keywords
      Force-distance spectroscopy
      Non-contact atomic force microscopy
      Short-range forces
      Si(1 0 0)(2 × 1)
      Small oscillation amplitudes
      Atomic force microscopy
      Imaging techniques
      Oscillations
      Scanning tunneling microscopy
      Surfaces
      Oscillation amplitudes
      Semiconducting silicon
      Permalink
      http://hdl.handle.net/11693/27576
      Published Version (Please cite this version)
      http://dx.doi.org/10.1016/S0169-4332(01)00942-4
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      • Department of Physics 2397
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