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dc.contributor.authorOral, Ahmeten_US
dc.contributor.authorKaval, Muraten_US
dc.contributor.authorDede, Müniren_US
dc.contributor.authorSandhu, A.en_US
dc.coverage.spatialAmsterdam, Netherlandsen_US
dc.date.accessioned2016-02-08T11:56:24Z
dc.date.available2016-02-08T11:56:24Z
dc.date.issued2002en_US
dc.identifier.issn0074-6843en_US
dc.identifier.urihttp://hdl.handle.net/11693/27553
dc.descriptionDate of Conference: 28 April-2 May 2002en_US
dc.descriptionConference Name: IEEE International Magnetics Conference, INTERMAG 2002en_US
dc.description.abstractThe room temperature scanning Hall probe microscopy (RT-SHPM) imaging of permalloy microstructures and garnet films was discussed. The high performance InSb Hall sensors were used for this purpose. It was shown that the InSb Hall probes were highly sensitive and low noise alternatives to GaAs sensors for RT-SHPM.en_US
dc.language.isoEnglishen_US
dc.source.titleProceedings of the IEEE International Magnetics Conference, INTERMAG 2002en_US
dc.relation.isversionofhttps://doi.org/10.1109/INTMAG.2002.1001104en_US
dc.subjectCrystal microstructureen_US
dc.subjectGarnetsen_US
dc.subjectImage sensorsen_US
dc.subjectImaging techniquesen_US
dc.subjectMagnetic fieldsen_US
dc.subjectMicroscopic examinationen_US
dc.subjectGarnet filmsen_US
dc.subjectMagnetic materialsen_US
dc.titleRT-SHPM imaging of permalloy microstructures and garnet films using new high performance INSB sensorsen_US
dc.typeConference Paperen_US
dc.departmentDepartment of Physicsen_US
dc.identifier.doi10.1109/INTMAG.2002.1001104en_US
dc.publisherIEEEen_US


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