Harmonic cantilevers for nanomechanical sensing of elastic properties
Zappe, S. F.
TRANSDUCERS 2003 - 12th International Conference on Solid-State Sensors, Actuators and Microsystems, Digest of Technical Papers
Institute of Electrical and Electronics Engineers Inc.
1124 - 1127
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We present a micromachined scanning probe cantilever, in which a specific higher order flexural mode is designed to be resonant at an exact integer multiple of the fundamental resonance frequency. We have demonstrated that such cantilevers enable sensing of nonlinear mechanical interactions between the atomically sharp tip at the free end of the cantilever and a surface with unknown mechanical properties in tapping-mode atomic force microscopy.
Atomic force microscopy
Fundamental resonance frequency
Tapping-mode atomic force microscopy