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      Noise, junction characteristics, and magnetic field dependencies of bicrystal grain boundary junction Rf-SQUIDs

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      Author
      Fardmanesh, Mehdi
      Schubert, J.
      Akram, Rizwan
      Bick, M.
      Banzet, M.
      Zander, W.
      Zhang, Y.
      Krause, H-J.
      Date
      2003
      Source Title
      IEEE Transactions on Applied Superconductivity
      Print ISSN
      1051-8223
      Publisher
      IEEE
      Volume
      13
      Issue
      2
      Pages
      873 - 876
      Language
      English
      Type
      Conference Paper
      Article
      Item Usage Stats
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      Abstract
      Bicrystal grain boundary (GB) Josephson junctions and rf-SQUID's were made of 200 nm thick PLD YBCO films on bi-crystal SrTiO3 substrates. The junction characteristics were studied to investigate optimal parameters in the rf-SQUID) layout designs and the limits imposed by the technology. The I c of 3 to 8 μm wide test junctions scaled with the junction widths, showing clear linear RSJ-like I-V characteristics at 77 K. All the junctions showed hysteretic RCSJ-like behavior at very low temperatures. Classical Josephson flux motion type (long junction) nonlinearity in I-V curves of all the junctions was also observed at lower temperatures with systematic dependence on the junction widths. Measurements of the magnetic field dependence of the Ic of the junctions resulted in junction width dependent well-defined Fraunhofer-pattern like characteristics. The obtained characteristics of the junctions led to feasible criteria for the rf-SQUID layouts with desired device characteristics. Rf-SQUID's were made using designs for optimal performance at 77 K while avoiding large superconducting weak links across the substrate GB. Devices with low noise characteristics and junction field sensitivities proper for operation in environmental background magnetic fields were obtained. A nonsystematic spread of optimal working temperature of the SQUID's were also observed which is associated to the spread of the junction parameters caused by the defects at the GB of substrates.
      Keywords
      Bicrystal
      Josephson junction
      Magnetic field
      Noise
      Rf-SQUID
      Current voltage characteristics
      Grain boundaries
      Josephson junction devices
      Permalink
      http://hdl.handle.net/11693/27531
      Published Version (Please cite this version)
      http://dx.doi.org/10.1109/TASC.2003.814073
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