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dc.contributor.authorFardmanesh, M.en_US
dc.contributor.authorSchubert, J.en_US
dc.contributor.authorAkram, R.en_US
dc.contributor.authorBick, M.en_US
dc.contributor.authorBanzet, M.en_US
dc.contributor.authorZander, W.en_US
dc.contributor.authorZhang, Y.en_US
dc.contributor.authorKrause, H-J.en_US
dc.date.accessioned2016-02-08T11:54:04Z
dc.date.available2016-02-08T11:54:04Z
dc.date.issued2004en_US
dc.identifier.issn0953-2048
dc.identifier.urihttp://hdl.handle.net/11693/27459
dc.description.abstractThe dc characteristics and magnetic field dependences of Y-Ba-Cu-O bicrystal grain boundary junctions (BGBJs) and step edge junctions (SEJs) were investigated for fabrication of rf-SQUIDs. Test junctions with up to 8 μm widths as well as the junctions of the two types of junction-based rf-SQUID were studied. The SEJs typically showed lower Jc and higher ρN as compared to the BGBJs, resulting in close IcRN products. All the BGBJs showed classical field dependent Ic following their junction width, resembling Fraunhofer patterns. The field sensitivity of the BGBJs' Uc led to low yield submicron BGBJ rf-SQUIDs partially impaired by the Earth's magnetic field. Two major behaviours of low and high field dependences of Ic were observed for the SEJs. Only the low field-sensitive SEJs resulted in micron size junction rf-SQUIDs not impaired by the Earth's magnetic field. The low field-sensitive SEJs led to low I/f noise magnetically stable rf-SQUIDs appropriate for applications in unshielded environments at 77 K.en_US
dc.language.isoEnglishen_US
dc.source.titleSuperconductor Science and Technologyen_US
dc.relation.isversionofhttp://dx.doi.org/10.1088/0953-2048/17/5/057en_US
dc.subjectCrystal microstructureen_US
dc.subjectCrystalsen_US
dc.subjectElectric potentialen_US
dc.subjectEtchingen_US
dc.subjectGrain boundariesen_US
dc.subjectIon beamsen_US
dc.subjectMagnetic field effectsen_US
dc.subjectMagnetometersen_US
dc.subjectSQUIDsen_US
dc.subjectStrontium compoundsen_US
dc.subjectTitanium oxidesen_US
dc.subjectYttrium barium copper oxidesen_US
dc.subjectCombinatorial ion beam etching (CIBE)en_US
dc.subjectJunction parametersen_US
dc.subjectStep edge junctions (SEJ)en_US
dc.subjectVoltage transferen_US
dc.subjectJosephson junction devicesen_US
dc.titleAnalysis of electrical characteristics and magnetic field dependences of YBCO step edge and bicrystal grain boundary junctions for rf-SQUID applicationsen_US
dc.typeArticleen_US
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.citation.spageS375en_US
dc.citation.epageS380en_US
dc.citation.volumeNumber17en_US
dc.citation.issueNumber5en_US
dc.identifier.doi10.1088/0953-2048/17/5/057en_US
dc.publisherInstitute of Physicsen_US


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