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dc.contributor.authorHoffmann P.M.en_US
dc.contributor.authorPatil, S.en_US
dc.contributor.authorMatei G.en_US
dc.contributor.authorTanulku, A.en_US
dc.contributor.authorGrimble, R.en_US
dc.contributor.authorÖzer Ö.en_US
dc.contributor.authorJeffery, S.en_US
dc.contributor.authorOral, Ahmeten_US
dc.contributor.authorPethica J.en_US
dc.date.accessioned2016-02-08T11:52:43Z
dc.date.available2016-02-08T11:52:43Z
dc.date.issued2004en_US
dc.identifier.issn02729172
dc.identifier.urihttp://hdl.handle.net/11693/27411
dc.description.abstractDynamic Atomic Force Microscopy (AFM) is typically performed at amplitudes that are quite large compared to the measured interaction range. This complicates the data interpretation as measurements become highly non-linear. A new dynamic AFM technique in which ultra-small amplitudes are used (as low as 0.15 Angstrom) is able to linearize measurements of nanomechanical phenomena in ultra-high vacuum (UHV) and in liquids. Using this new technique we have measured single atom bonding, atomic-scale dissipation and molecular ordering in liquid layers, including water. © 2005 Materials Research Society.en_US
dc.language.isoEnglishen_US
dc.source.titleMaterials Research Society Symposium Proceedingsen_US
dc.subjectAtom bondingen_US
dc.subjectLiquid layersen_US
dc.subjectMolecular orderingen_US
dc.subjectAtomic force microscopyen_US
dc.subjectChemical bondsen_US
dc.subjectMolecular interactionsen_US
dc.subjectMolecular orientationen_US
dc.subjectNanostructured materialsen_US
dc.subjectUltrahigh vacuumen_US
dc.subjectNanomechanicsen_US
dc.titleLinear measurements of nanomechanical phenomena using small-amplitude AFMen_US
dc.typeConference Paperen_US
dc.departmentDepartment of Physics
dc.citation.spage7en_US
dc.citation.epage12en_US
dc.citation.volumeNumber838en_US
dc.identifier.doihttps://doi.org/10.1557/PROC-838-O1.8


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