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      Linear measurements of nanomechanical phenomena using small-amplitude AFM

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      Author
      Hoffmann, P. M.
      Patil, S.
      Matei, G.
      Tanülkü, A.
      Grimble, R.
      Özer, Ö.
      Jeffery, S.
      Oral, Ahmet
      Pethica, J.
      Date
      2004
      Source Title
      Symposium O – Scanning Probe and Other Novel Microscopies of Local Phenomena in Nanostructured Materials
      Print ISSN
      0272-9172
      Publisher
      Materials Research Society
      Volume
      838
      Pages
      7 - 12
      Language
      English
      Type
      Conference Paper
      Item Usage Stats
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      Abstract
      Dynamic Atomic Force Microscopy (AFM) is typically performed at amplitudes that are quite large compared to the measured interaction range. This complicates the data interpretation as measurements become highly non-linear. A new dynamic AFM technique in which ultra-small amplitudes are used (as low as 0.15 Angstrom) is able to linearize measurements of nanomechanical phenomena in ultra-high vacuum (UHV) and in liquids. Using this new technique we have measured single atom bonding, atomic-scale dissipation and molecular ordering in liquid layers, including water.
      Keywords
      Atom bonding
      Liquid layers
      Molecular ordering
      Atomic force microscopy
      Chemical bonds
      Molecular interactions
      Molecular orientation
      Nanostructured materials
      Ultrahigh vacuum
      Nanomechanics
      Permalink
      http://hdl.handle.net/11693/27411
      Published Version (Please cite this version)
      https://doi.org/10.1557/PROC-838-O1.8
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      • Department of Physics 2299
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