Linear measurements of nanomechanical phenomena using small-amplitude AFM
Hoffmann, P. M.
Symposium O – Scanning Probe and Other Novel Microscopies of Local Phenomena in Nanostructured Materials
Materials Research Society
7 - 12
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Dynamic Atomic Force Microscopy (AFM) is typically performed at amplitudes that are quite large compared to the measured interaction range. This complicates the data interpretation as measurements become highly non-linear. A new dynamic AFM technique in which ultra-small amplitudes are used (as low as 0.15 Angstrom) is able to linearize measurements of nanomechanical phenomena in ultra-high vacuum (UHV) and in liquids. Using this new technique we have measured single atom bonding, atomic-scale dissipation and molecular ordering in liquid layers, including water.
Atomic force microscopy