Identification of insect damaged wheat kernels using transmittance images
Proceedings - International Conference on Image Processing, ICIP
2917 - 2920
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Please cite this item using this persistent URLhttp://hdl.handle.net/11693/27406
We used transmittance images and different learning algorithms to classify insect damaged and un-damaged wheat kernels. Using the histogram of the pixels of the wheat images as the feature, and the linear model as the learning algorithm, we achieved a False Positive Rate (1-specificity) of 0.2 at the True Positive Rate (sensitivity) of 0.8 and an Area Under the ROC Curve (AUC) of 0.86. Combining the linear model and a Radial Basis Function Network in a committee resulted in a FP Rate of 0.1 at the TP Rate of 0.8 and an AUC of 0.92. © 2004 IEEE.
- Conference Paper 2294