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dc.contributor.authorGuven, K.en_US
dc.contributor.authorAydin, K.en_US
dc.contributor.authorOzbay, E.en_US
dc.date.accessioned2016-02-08T11:51:09Z
dc.date.available2016-02-08T11:51:09Z
dc.date.issued2005-12en_US
dc.identifier.issn1569-4410
dc.identifier.urihttp://hdl.handle.net/11693/27347
dc.description.abstractWe report the true left-handed transmission of a composite metamaterial (CMM) consisting of periodically stacked split-ring resonator (SRR) and wire elements. The negative permeability (μ < 0) gap is demonstrated explicitly by comparing SRR and closed-ring resonator structures. We confirm experimentally that the plasma cut-off frequency of the CMM is determined by the combined dielectric response of SRR and wire elements, and it is much lower than that of the wire-only medium. This is crucial to identify the left-handed transmission bands of the CMM. We further investigate the effect of intralayer and interlayer disorder on the transmission spectrum of CMM arising from misaligned fabrication and stacking of the SRR layers. We found that the intralayer disorder affects the μ < 0 gap of SRRs and the left-handed transmission band of CMM significantly, whereas the SRR transmission is rather immune to interlayer disorder.en_US
dc.language.isoEnglishen_US
dc.source.titlePhotonics and Nanostructures - Fundamentals and Applicationsen_US
dc.relation.isversionofhttps://doi.org/10.1016/j.photonics.2005.09.004en_US
dc.subject41.20.Jben_US
dc.subject78.20.Cien_US
dc.subject42.70.-aen_US
dc.subject81.05.-ten_US
dc.subjectLeft-handed materialen_US
dc.subjectNegative refractionen_US
dc.subjectSplit ring resonatoren_US
dc.subjectComposite materialsen_US
dc.titleExperimental analysis of true left-handed behaviour and transmission properties of composite metamaterialsen_US
dc.typeArticleen_US
dc.departmentDepartment of Physics
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.citation.spage75en_US
dc.citation.epage78en_US
dc.citation.volumeNumber3en_US
dc.citation.issueNumber2-3en_US
dc.identifier.doi10.1016/j.photonics.2005.09.004en_US
dc.publisherElsevieren_US


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