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dc.contributor.authorAytaç, Tayfunen_US
dc.contributor.authorBarshan, Billuren_US
dc.coverage.spatialEdmonton, Alta, Canadaen_US
dc.date.accessioned2016-02-08T11:50:11Z
dc.date.available2016-02-08T11:50:11Z
dc.date.issued2005en_US
dc.identifier.urihttp://hdl.handle.net/11693/27305
dc.descriptionDate of Conference: 2-6 August 2005en_US
dc.descriptionConference Name: IEEE/RSJ International Conference on Intelligent Robots and Systems, IROS 2005en_US
dc.description.abstractIn this study, surfaces with different properties are differentiated with simple low-cost infrared (IR) emitters and detectors in a location-invariant manner. The intensity readings obtained from such sensors are highly dependent on the location and properties of the surface, which complicates the differentiation and localization process. Our approach, which models IR intensity scans parametrically, can distinguish different surfaces independent of their positions. The method is verified experimentally with wood, Styrofoam packaging material, white painted wall, white and black cloth, and white, brown, and violet paper. A correct differentiation rate of 100% is achieved for six surfaces and the surfaces are localized within absolute range and azimuth errors of 0.2 cm and 1.1°, respectively. The differentiation rate decreases to 86% for seven surfaces and to 73% for eight surfaces. The method demonstrated shows that simple IR sensors, when coupled with appropriate processing, can be used to differentiate different types of surfaces in a location-invariant manner.en_US
dc.language.isoEnglishen_US
dc.source.titleProceedings of the IEEE/RSJ International Conference on Intelligent Robots and Systems, IROS 2005en_US
dc.relation.isversionofhttp://dx.doi.org/10.1109/IROS.2005.1545319en_US
dc.subjectSurface differentiationen_US
dc.subjectInfrared sensorsen_US
dc.subjectPosition estimationen_US
dc.subjectLambertian reflectionen_US
dc.subjectFeature extractionen_US
dc.titleSurface differentiation and localization by parametric modeling of infrared intensity scansen_US
dc.typeConference Paperen_US
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.citation.spage2294en_US
dc.citation.epage2299en_US
dc.identifier.doi10.1109/IROS.2005.1545319en_US
dc.publisherIEEEen_US


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