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      Verification of impedance matching at the surface of left-handed materials

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      Author
      Aydın, Koray
      Bulu, İrfan
      Özbay, Ekmel
      Date
      2006
      Source Title
      Microwave and Optical Technology Letters
      Print ISSN
      0895-2477
      Publisher
      Wiley
      Volume
      48
      Issue
      12
      Pages
      2548 - 2552
      Language
      English
      Type
      Article
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      Abstract
      Impedance matching at the surface of left-handed materials (LHM) is required for certain applications including a perfect lens. In this study, we present the experimental and theoretical verification of an impedance-matched LHM to free space. Reflection characteristics of both one-dimensional and two-dimensional LHM were investigated. The reflection was observed to be very low at a narrow frequency range. FDTD simulations and retrieval procedures were used to theoretically verify impedance matching. By varying the number of layers along the propagation direction, the ultralow reflection at specific frequencies was shown to be independent of the sample thickness. © 2006 Wiley Periodicals, Inc.
      Keywords
      Impedance matching
      Left-handed materials
      Metamaterials
      Perfect lens
      Reflection
      Computer simulation
      Electromagnetic wave reflection
      Finite difference method
      Lenses
      Natural frequencies
      Time domain analysis
      Wave propagation
      FDTD simulations
      Permalink
      http://hdl.handle.net/11693/27204
      Published Version (Please cite this version)
      http://dx.doi.org/10.1002/mop.22003
      Collections
      • Department of Electrical and Electronics Engineering 3524
      • Department of Physics 2299
      • Institute of Materials Science and Nanotechnology (UNAM) 1775
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