Show simple item record

dc.contributor.authorPanayırcı, Erdalen_US
dc.contributor.authorÇırpan, H. A.en_US
dc.contributor.authorMoeneclaey, M.en_US
dc.contributor.authorNoels, N.en_US
dc.coverage.spatialOberpfaffenhofen, Germanyen_US
dc.date.accessioned2016-02-08T11:46:19Z
dc.date.available2016-02-08T11:46:19Z
dc.date.issued2006en_US
dc.identifier.urihttp://hdl.handle.net/11693/27162
dc.descriptionDate of Conference: 14-16 September 2005en_US
dc.descriptionConference Name: 5th International Workshop on Multi-Carrier Spread-Spectrum, MC-SS 2005en_US
dc.description.abstractIn this paper, based on a sequential Monte Carlo method, a computationally efficient algorithm is presented for estimating the residual phase noise, blindly, generated at the output the phase tracking loop employed in OFDM systems. The basic idea is to treat the transmitted symbols as "missing data" and draw samples sequentially of them based on the observed signal samples up to time t. This way, the Bayesian estimates of the phase noise is obtained through these samples, sequentially drawn, together with their importance weights. The proposed receiver structure is seen to be ideally suited for high-speed parallel implementation using VLSI technology.en_US
dc.language.isoEnglishen_US
dc.source.titleProceedings of the 5th International Workshop on Multi-Carrier Spread-Spectrum, MC-SS 2005en_US
dc.relation.isversionofhttps://doi.org/10.1007/1-4020-4437-2_52en_US
dc.subjectBayesian estimateen_US
dc.subjectComputationally efficienten_US
dc.subjectImportance weightsen_US
dc.subjectParallel implementationsen_US
dc.subjectPhase tracking loopsen_US
dc.subjectReceiver structureen_US
dc.subjectResidual phase noiseen_US
dc.subjectSequential Monte Carlo methodsen_US
dc.subjectBayesian networksen_US
dc.subjectMonte Carlo methodsen_US
dc.subjectOrthogonal frequency division multiplexingen_US
dc.subjectTelecommunication systemsen_US
dc.subjectPhase noiseen_US
dc.titleBlind phase noise estimation in OFDM systems by sequential Monte Carlo methoden_US
dc.typeConference Paperen_US
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.citation.spage483en_US
dc.citation.epage490en_US
dc.identifier.doi10.1007/1-4020-4437-2_52en_US
dc.publisherSpringeren_US


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record