• About
  • Policies
  • What is openaccess
  • Library
  • Contact
Advanced search
      View Item 
      •   BUIR Home
      • Scholarly Publications
      • Faculty of Engineering
      • Department of Electrical and Electronics Engineering
      • View Item
      •   BUIR Home
      • Scholarly Publications
      • Faculty of Engineering
      • Department of Electrical and Electronics Engineering
      • View Item
      JavaScript is disabled for your browser. Some features of this site may not work without it.

      Computer-controlled characterization of high-voltage, high-frequency SiC devices?

      Thumbnail
      View / Download
      606.7 Kb
      Author
      Ortiz-Rodriguez, J. M.
      Hefner, A. R.
      Berning, D.
      Hood, C.
      Ölçüm, Selim
      Date
      2006
      Source Title
      Proceedings of the 10th IEEE Workshop on Computers in Power Electronics, IEEE 2006
      Print ISSN
      1093-5142
      Publisher
      IEEE
      Pages
      300 - 305
      Language
      English
      Type
      Conference Paper
      Item Usage Stats
      140
      views
      91
      downloads
      Abstract
      A software-based high-voltage curve tracer application for SiC device characterization is presented. This flexible application interface is developed to define testing parameters needed to control the hardware of a custom-made 25 kV-capable SiC characterization test bed. Data acquisition is controlled for optimum resolution, and I-V characterization is computed by means of a user-defined time interval based on the shape of the applied power pulses. Both voltage and current waveforms are displayed for each data point captured to allow the user to observe transient effects. Additionally, the software allows archiving some or all of these transient waveforms. Acquired results are shown to demonstrate functionality and flexibility of the new system.
      Keywords
      Data acquisition
      Equipment testing
      Silicon carbide
      Computer-controlled
      Current waveforms
      Data points
      Device characterization
      High-frequency (HF)
      High-voltage (HV)
      I-V characterization
      Power pulses
      SiC devices
      Software-based
      Test beds
      Time intervals
      Transient effects
      Waveforms
      Power electronics
      Permalink
      http://hdl.handle.net/11693/27158
      Published Version (Please cite this version)
      http://dx.doi.org/10.1109/COMPEL.2006.305630
      Collections
      • Department of Electrical and Electronics Engineering 3524
      Show full item record

      Browse

      All of BUIRCommunities & CollectionsTitlesAuthorsAdvisorsBy Issue DateKeywordsTypeDepartmentsThis CollectionTitlesAuthorsAdvisorsBy Issue DateKeywordsTypeDepartments

      My Account

      Login

      Statistics

      View Usage StatisticsView Google Analytics Statistics

      Bilkent University

      If you have trouble accessing this page and need to request an alternate format, contact the site administrator. Phone: (312) 290 1771
      Copyright © Bilkent University - Library IT

      Contact Us | Send Feedback | Off-Campus Access | Admin | Privacy