Dependence of Josephson junction critical current on the deposition rate of YBa2Cu3O7-δ thin films
Algul, B. P.
AIP Conference Proceedings
A I P Publishing LLC
MetadataShow full item record
Please cite this item using this persistent URLhttp://hdl.handle.net/11693/27099
We have reported the effect of YBa2Cu3O 7-δ (YBCO) thin film deposition rate on the 24 and 30 degree STO bicrystal Josephson junctions critical currents by fabricating series of junctions with different deposition rates. Dependence of YBCO thin film structures on the deposition rate was investigated. We have observed that the critical currents of junctions are strongly affected by the thin film deposition rate. © 2007 American Institute of Physics.