Dependence of Josephson junction critical current on the deposition rate of YBa2Cu3O7-δ thin films

Thumbnail
Author
Algul, B. P.
Avci, I.
Akram, R.
Bozbey, A.
Tepe, M.
Abukay, D.
Date
2007
Source Title
AIP Conference Proceedings
Print ISSN
0094-243X
Publisher
A I P Publishing LLC
Volume
899
Pages
762
Language
English
Type
Conference Paper
Item Usage Stats
45
views
31
downloads
Metadata
Show full item record
Abstract
We have reported the effect of YBa2Cu3O 7-δ (YBCO) thin film deposition rate on the 24 and 30 degree STO bicrystal Josephson junctions critical currents by fabricating series of junctions with different deposition rates. Dependence of YBCO thin film structures on the deposition rate was investigated. We have observed that the critical currents of junctions are strongly affected by the thin film deposition rate. © 2007 American Institute of Physics.
Keywords
Deposition rate
Josephson junctions
Permalink
http://hdl.handle.net/11693/27099
Published Version (Please cite this version)
https://doi.org/10.1063/1.2733503
Collections