Dependence of Josephson junction critical current on the deposition rate of YBa2Cu3O7-δ thin films
Algül, B. P.
AIP Conference Proceedings
American Institute of Physics
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We have reported the effect of YBa2Cu3O 7-δ (YBCO) thin film deposition rate on the 24 and 30 degree STO bicrystal Josephson junctions critical currents by fabricating series of junctions with different deposition rates. Dependence of YBCO thin film structures on the deposition rate was investigated. We have observed that the critical currents of junctions are strongly affected by the thin film deposition rate.