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      • Department of Electrical and Electronics Engineering
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      Dependence of Josephson junction critical current on the deposition rate of YBa2Cu3O7-δ thin films

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      Author(s)
      Algül, B. P.
      Avcı, İ.
      Akram, R.
      Bozbey, Ali
      Tepe, M.
      Abukay, D.
      Date
      2007
      Source Title
      AIP Conference Proceedings
      Print ISSN
      0094-243X
      Publisher
      American Institute of Physics
      Volume
      899
      Pages
      762
      Language
      English
      Type
      Conference Paper
      Item Usage Stats
      155
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      119
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      Abstract
      We have reported the effect of YBa2Cu3O 7-δ (YBCO) thin film deposition rate on the 24 and 30 degree STO bicrystal Josephson junctions critical currents by fabricating series of junctions with different deposition rates. Dependence of YBCO thin film structures on the deposition rate was investigated. We have observed that the critical currents of junctions are strongly affected by the thin film deposition rate.
      Keywords
      Deposition rate
      Josephson junctions
      Permalink
      http://hdl.handle.net/11693/27099
      Published Version (Please cite this version)
      https://doi.org/10.1063/1.2733503
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      • Department of Electrical and Electronics Engineering 3702
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