Dependence of Josephson junction critical current on the deposition rate of YBa2Cu3O7-δ thin films

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Author
Algul, B. P.
Avci, I.
Akram, R.
Bozbey, A.
Tepe, M.
Abukay, D.
Date
2007
Journal Title
AIP Conference Proceedings
Print ISSN
0094-243X
Publisher
A I P Publishing LLC
Volume
899
Pages
762
Language
English
Type
Conference Paper
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Please cite this item using this persistent URL
http://hdl.handle.net/11693/27099
Abstract
We have reported the effect of YBa2Cu3O 7-δ (YBCO) thin film deposition rate on the 24 and 30 degree STO bicrystal Josephson junctions critical currents by fabricating series of junctions with different deposition rates. Dependence of YBCO thin film structures on the deposition rate was investigated. We have observed that the critical currents of junctions are strongly affected by the thin film deposition rate. © 2007 American Institute of Physics.
Published as
https://doi.org/10.1063/1.2733503
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