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      • Department of Electrical and Electronics Engineering
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      Femtosecond Yb-doped fiber laser system at 1 μm of wavelength with 100-nm bandwidth and variable pulse structure for accelerator diagnostics

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      Author
      Winter, A.
      İlday, F. Ömer
      Steffen, B.
      Date
      2007-05
      Source Title
      8th European Workshop on Beam Diagnostics and Instrumentation for Particle Accelerators, DIPAC 2007
      Pages
      235 - 237
      Language
      English
      Type
      Conference Paper
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      Abstract
      Laser-based diagnostic systems play an increasingly important role in accelerator diagnostics in, for instance, electron bunch length measurements. To date, the laser system of choice for electro-optic experiments has been the Ti:sapphire laser, providing several nanojoules of pulse energies at fixed a repetition rate, which is not well suited to the bunch structure of accelerator facilities such as FLASH. Limited long-term stability and operability of Ti:sapphire systems are significant drawbacks for a continuously running measurement system requiring minimal maintenance and maximum uptime. We propose fiber lasers as a promising alternative with significant advantages. Gating of the pulse train to match the bunch profile is simple with fibercoupled modulators, in contrast to bulk modulators needed for Ti:sapphire lasers. An in-line fiber amplifier can boost the power, such that a constant pulse energy is maintained regardless of the chosen pulse pattern. Significantly, these lasers offer excellent robustness at a fraction of the cost of a Ti:sapphire laser and occupy a fraction of the optical table space.
      Keywords
      Accelerator facilities
      Diagnostic systems
      Electron bunch length measurement
      Long term stability
      Measurement system
      Pulse structures
      Ti: Sapphire laser
      Yb-doped fiber lasers
      Amplifiers (electronic)
      Fiber amplifiers
      Modulators
      Particle accelerators
      Q switched lasers
      Sapphire
      Laser diagnostics
      Permalink
      http://hdl.handle.net/11693/26916
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      • Department of Electrical and Electronics Engineering 3524
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