Show simple item record

dc.contributor.authorAltun, Keremen_US
dc.contributor.authorBarshan, Billuren_US
dc.coverage.spatialLausanne, Switzerland
dc.date.accessioned2016-02-08T11:35:41Z
dc.date.available2016-02-08T11:35:41Z
dc.date.issued2008-08en_US
dc.identifier.urihttp://hdl.handle.net/11693/26783
dc.descriptionDate of Conference: 25-29 Aug. 2008
dc.descriptionConference name: 16th European Signal Processing Conference, 2008
dc.description.abstractActive snake contours and Kohonen's self-organizing feature maps (SOM) are considered for efficient representation and evaluation of the maps of an environment obtained with different ultrasonic arc map (UAM) processing techniques. The mapping results are compared with a reference map acquired with a very accurate laser system. Both approaches are convenient ways of representing and comparing the map points obtained with different techniques among themselves, as well as with an absolute reference. Snake curve fitting results in more accurate maps than SOM since it is more robust to outliers. The two methods are sufficiently general that they can be applied to discrete point maps acquired with other mapping techniques and other sensing modalities as well. copyright by EURASIP.en_US
dc.language.isoEnglishen_US
dc.source.title16th European Signal Processing Conference, 2008en_US
dc.relation.isversionofhttps://ieeexplore.ieee.org/abstract/document/7080422
dc.subjectActive contoursen_US
dc.subjectActive snakesen_US
dc.subjectDiscrete pointsen_US
dc.subjectKohonen's Self-organizing Feature Mapsen_US
dc.subjectLaser systemsen_US
dc.subjectMapping techniquesen_US
dc.subjectProcessing techniqueen_US
dc.subjectReference mapen_US
dc.subjectSensing modalitiesen_US
dc.subjectUltrasonic rangeen_US
dc.subjectConformal mappingen_US
dc.subjectCurve fittingen_US
dc.subjectSelf organizing mapsen_US
dc.subjectSignal processingen_US
dc.titleEmploying active contours and artificial neural networks in representing ultrasonic range dataen_US
dc.typeConference Paperen_US
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.citation.spage1en_US
dc.citation.epage5en_US
dc.publisherIEEE


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record