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dc.contributor.authorKeskin, H.en_US
dc.contributor.authorAltan, H.en_US
dc.contributor.authorYavas, S.en_US
dc.contributor.authorIlday, F. O.en_US
dc.contributor.authorEken, K.en_US
dc.contributor.authorSahin, A. B.en_US
dc.date.accessioned2016-02-08T11:02:07Z
dc.date.available2016-02-08T11:02:07Z
dc.date.issued2014en_US
dc.identifier.issn0306-8919
dc.identifier.urihttp://hdl.handle.net/11693/26603
dc.description.abstractScientists in terahertz (THz) wave technologies have benefited from the recent developments in ultrafast laser technologies and RF technologies and applied these new gained techniques into characterizing a wide variety of phenomena. Undoubtedly, the most successful of these applications has been in the development of time-domain terahertz spectroscopic and imaging systems which has been utilized in the characterization of dielectrics and semiconductors. This pulsed technique has allowed users to characterize dynamical behavior inside materials under illumination with picosecond resolution. Typically pump/probe or similar dynamical measurements require the use of amplified pulses derived from free-space solid state lasers in the μJ-mJ range and since interferometric techniques are typically used in pulsed measurements the measurement time of a THz spectrum can last at least tens of minutes. Better systems can be realized based on fiber laser technologies. Here we discuss the advantages of a THz spectrometer driven by an ultrafast Ytterbium doped fiber laser whose repetition rate can be tuned rapidly allowing for rapid dynamical measurements. The efficient gain medium, robust operation and compact design of the system opens up the possibility of exploring rapid detection of various materials as well as studying dynamical behavior using the high brightness source.en_US
dc.language.isoEnglishen_US
dc.source.titleOptical and Quantum Electronicsen_US
dc.relation.isversionofhttp://dx.doi.org/10.1007/s11082-013-9794-xen_US
dc.subjectFiber laseren_US
dc.subjectRapid scanen_US
dc.subjectTDSen_US
dc.subjectTHzen_US
dc.subjectTRTSen_US
dc.subjectCharacterizationen_US
dc.subjectDynamicsen_US
dc.subjectFiber lasersen_US
dc.subjectInterferometryen_US
dc.subjectSpectrometersen_US
dc.subjectTechnologyen_US
dc.subjectUltrafast lasersen_US
dc.subjectInterferometric techniquesen_US
dc.subjectTDSen_US
dc.subjectTerahertz spectrometeren_US
dc.subjectTHzen_US
dc.subjectUltrafast laser technologyen_US
dc.subjectYtterbium-doped fiber lasersen_US
dc.subjectTerahertz wavesen_US
dc.titleDevelopment of a rapid-scan fiber-integrated terahertz spectrometeren_US
dc.typeArticleen_US
dc.departmentDepartment of Physics
dc.departmentDepartment of Electrical and Electronics Engineering
dc.citation.spage495en_US
dc.citation.epage503en_US
dc.citation.volumeNumber46en_US
dc.citation.issueNumber4en_US
dc.identifier.doi10.1007/s11082-013-9794-xen_US
dc.publisherSpringer New York LLCen_US


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