A near-infrared range photodetector based on indium nitride nanocrystals obtained through laser ablation
Okyay, A., K.
IEEE Electron Device Letters
936 - 938
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Please cite this item using this persistent URLhttp://hdl.handle.net/11693/26395
We present a proof-of-concept photodetector that is sensitive in the near-infrared (NIR) range based on InN nanocrystals. Indium nitride nanocrystals (InN-NCs) are obtained through laser ablation of a high pressure chemical vapor deposition grown indium nitride thin film and are used as optically active absorption region. InN-NCs are sandwiched between thin insulating films to reduce the electrical leakage current. Under-1 V applied bias, the recorded photoresponsivity values within 600-1100-nm wavelength range are as high as (3.05 × 10-2) mA/W. An ultrathin layer of nanocrystalline InN thin film is, therefore, a promising candidate for NIR detection in large area schemes. © 2014 IEEE.
Chemical vapor deposition
High pressure chemical vapor deposition
Near infra red
Thin insulating film