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      Comparison of local and global computation and its implications for the role of optical interconnections in future nanoelectronic systems

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      Author(s)
      Özaktaş, Haldun M.
      Goodman J. W.
      Date
      1993
      Source Title
      Optics Communications
      Print ISSN
      0030-4018
      Publisher
      Elsevier
      Volume
      100
      Issue
      1-4
      Pages
      247 - 258
      Language
      English
      Type
      Article
      Item Usage Stats
      199
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      Abstract
      Various methods of simulating diffusion phenomena with parallel hardware are discussed. In particular methods are compared requiring local and global communication among the processors in terms of total computation time. Systolic convolution on a locally connected array is seen to exhibit an asymptotic advantage over Fourier methods on a globally connected array. Whereas this may translate into a numerical advantage for extremely large numbers of ultrafast devices for two-dimensional systems, this is unlikely for three-dimensional systems. Thus global Fourier methods will be advantageous for three-dimensional systems for foreseeable device speeds and system sizes. The fact that optical interconnections are potentially advantageous for implementing the longer connections of such globally connected systems suggests that they can be beneficially employed in future nanoelectronic computers. Heat removal considerations play an important role in our conclusions.
      Keywords
      Computational complexity
      Computational methods
      Data communication equipment
      Fourier transforms
      Heat transfer
      Integrated optoelectronics
      Mathematical models
      Optical communication
      Optical interconnects
      Parallel processing systems
      Performance
      Three dimensional
      Fourier methods
      Global computation
      Local computation
      Systolic convolution
      Optical data processing
      Permalink
      http://hdl.handle.net/11693/26040
      Published Version (Please cite this version)
      http://dx.doi.org/10.1016/0030-4018(93)90587-U
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      • Department of Electrical and Electronics Engineering 4011
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