Dynamical screening effects in hot-electron scattering from electron-hole plasma and LO-phonon modes in quantum wires
Date
1996Source Title
Solid State Communications
Print ISSN
0038-1098
Publisher
Elsevier
Volume
99
Issue
7
Pages
509 - 512
Language
English
Type
ArticleItem Usage Stats
266
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201
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Abstract
We present a fully dynamical and finite temperature study of the hot-electron momentum relaxation rate and the power loss in a coupled system of electron-hole plasma and bulk LO-phonons in a quantum wire structure. Interactions of the scattered electron with neutral plasma components and phonons are treated on an equal footing within the random-phase approximation. Coupled mode effects substantially change the transport properties of the system at low temperatures. Particularly, the "plasmon-like" and "LO-phonon-like" excitations yield comparable rates which, as a consequence of the singular nature of the ID density of states, can be large at the threshold. This is in contrast to room temperature results where only the LO-phonon mode contributes significantly to the rate. The density and temperature dependence of the power loss reveals that dynamical screening effects are important, and energy-momentum conservation cannot be satisfied above a certain density for a given initial energy.
Keywords
Approximation theoryElectron energy levels
Electron scattering
Electron transport properties
Electronic density of states
Energy conservation
Hot carriers
Phonons
Random processes
Relaxation processes
Semiconductor device structures
Dynamical screening effects
Electron hole plasma
Energy momentum conservation
Hot electron momentum relaxation
Hot electron scattering
Neutral plasma components
Photoexcited quasi one dimensional structure
Plasmon phonon coupling
Power loss
Random phase approximation
Semiconductor quantum wires
Permalink
http://hdl.handle.net/11693/25797Published Version (Please cite this version)
http://dx.doi.org/10.1016/0038-1098(96)00266-9Collections
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