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dc.contributor.authorÖzbay, Ekmelen_US
dc.contributor.authorTemelkuran, B.en_US
dc.date.accessioned2016-02-08T10:50:27Z
dc.date.available2016-02-08T10:50:27Z
dc.date.issued1996-08-05en_US
dc.identifier.issn0003-6951
dc.identifier.urihttp://hdl.handle.net/11693/25788
dc.description.abstractWe have investigated the surface reflection properties of a layer-by-layer photonic crystal. By using a Fabry-Perot resonant cavity analogy along with the reflection-phase information of the photonic crystal, we predicted defect frequencies of planar defect structures. Our predictions were in good agreement with the measured defect frequencies. Our simple model can also predict and explain double defect formation within the photonic band gap.en_US
dc.language.isoEnglishen_US
dc.source.titleApplied Physics Lettersen_US
dc.subjectBand structureen_US
dc.subjectCavity resonatorsen_US
dc.subjectCrystal defectsen_US
dc.subjectCrystal structureen_US
dc.subjectElectric network analyzersen_US
dc.subjectElectromagnetic wave reflectionen_US
dc.subjectElectromagnetic wave transmissionen_US
dc.subjectEnergy gapen_US
dc.subjectMathematical modelsen_US
dc.subjectMicrowave measurementen_US
dc.subjectSurface propertiesen_US
dc.subjectDefect formationen_US
dc.subjectFabry Perot resonant cavityen_US
dc.subjectPhotonic crystalsen_US
dc.subjectCrystalsen_US
dc.titleReflection properties and defect formation in photonic crystalsen_US
dc.typeArticleen_US
dc.departmentDepartment of Physicsen_US
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.departmentInstitute of Materials Science and Nanotechnology (UNAM)en_US
dc.citation.spage743en_US
dc.citation.epage745en_US
dc.citation.volumeNumber69en_US
dc.citation.issueNumber6en_US
dc.publisherA I P Publishing LLCen_US
dc.contributor.bilkentauthorÖzbay, Ekmel
dc.identifier.eissn1077-3118


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