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dc.contributor.authorToklu, C.en_US
dc.contributor.authorErdem, A. T.en_US
dc.contributor.authorSezan, M. I.en_US
dc.contributor.authorTekalp, A. M.en_US
dc.date.accessioned2016-02-08T10:50:05Z
dc.date.available2016-02-08T10:50:05Z
dc.date.issued1996-11en_US
dc.identifier.issn1077-3169
dc.identifier.urihttp://hdl.handle.net/11693/25762
dc.description.abstractWe propose a method for tracking the motion and intensity variations of a 2-D mildly deformable image object using a hierarchical 2-D mesh model. The proposed method is applied to synthetic object transfiguration, namely, replacing an object in a real video clip with another synthetic or natural object via digital postprocessing. Successful transfiguration requires accurate tracking of both motion and intensity (contrast and brightness) variations of the object-to-be-replaced so that the replacement object can be rendered in exactly the same way from a single still picture. The proposed method is capable of tracking image regions corresponding to scene objects with nonplanar and/or mildly deforming surfaces, accounting for intensity variations, and is shown to be effective with real image sequences.en_US
dc.description.sponsorshipNational Science Foundation SIUCRCen_US
dc.description.sponsorshipNew York State Science and Technology Foundationen_US
dc.description.sponsorshipEastman Kodak Companyen_US
dc.language.isoEnglishen_US
dc.source.titleGraphical Models and Image Processingen_US
dc.relation.isversionofhttp://dx.doi.org/10.1006/gmip.1996.0046en_US
dc.subjectDigital signal processingen_US
dc.subjectHierarchical systemsen_US
dc.subjectSurface propertiesen_US
dc.subjectVideo signal processingen_US
dc.subjectIntensity variationsen_US
dc.subjectMesh modelingen_US
dc.subjectSynthetic object transfigurationen_US
dc.subjectTracking motionen_US
dc.subjectImage processingen_US
dc.titleTracking motion and intensity variations using hierarchical 2-D mesh modeling for synthetic object transfigurationen_US
dc.typeArticleen_US
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.citation.spage553en_US
dc.citation.epage573en_US
dc.citation.volumeNumber58en_US
dc.citation.issueNumber6en_US
dc.identifier.doi10.1006/gmip.1996.0046en_US
dc.identifier.eissn1090-2481


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