Electron spectroscopy for material characterization
Date
1998
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Abstract
Basic principles of the two electron spectroscopic techniques, the x-ray photoelectron spectroscopy, XPS, and the Auger electron spectroscopy, AES, are given. Their utilization in material characterization are introduced through examples with application of these techniques to various surface related problems.
Source Title
Turkish Journal of Chemistry
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TÜBİTAK
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English