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      Electron spectroscopy for material characterization

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      Author(s)
      Süzer, Şefik
      Date
      1998
      Source Title
      Turkish Journal of Chemistry
      Print ISSN
      1300-0527
      Publisher
      TÜBİTAK
      Volume
      22
      Issue
      4
      Pages
      309 - 319
      Language
      English
      Type
      Article
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      149
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      Abstract
      Basic principles of the two electron spectroscopic techniques, the x-ray photoelectron spectroscopy, XPS, and the Auger electron spectroscopy, AES, are given. Their utilization in material characterization are introduced through examples with application of these techniques to various surface related problems.
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      http://hdl.handle.net/11693/25372
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