Electron spectroscopy for material characterization
Author(s)
Date
1998Source Title
Turkish Journal of Chemistry
Print ISSN
1300-0527
Publisher
TÜBİTAK
Volume
22
Issue
4
Pages
309 - 319
Language
English
Type
ArticleItem Usage Stats
149
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Abstract
Basic principles of the two electron spectroscopic techniques, the x-ray photoelectron spectroscopy, XPS, and the Auger electron spectroscopy, AES, are given. Their utilization in material characterization are introduced through examples with application of these techniques to various surface related problems.