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dc.contributor.authorBarshan, B.en_US
dc.contributor.authorBaşkent, D.en_US
dc.date.accessioned2016-02-08T10:42:26Z
dc.date.available2016-02-08T10:42:26Z
dc.date.issued1999en_US
dc.identifier.issn1091-5281
dc.identifier.urihttp://hdl.handle.net/11693/25296
dc.description.abstractA novel method is described for surface profile extraction based on morphological processing of multiple range sensor data. The approach taken is extremely flexible and robust, in addition to being simple and straightforward. It can deal with arbitrary numbers and configurations of range sensors as well as synthetic arrays. The method has the intrinsic ability to suppress spurious readings, crosstalk, and higher-order reflections, and process multiple reflections informatively. The essential idea of this work - the use of multiple range sensors combined with morphological processing - can be applied to different physical modalities of range sensing of vastly different scales and in many different areas. These may include radar, sonar, robotics, optical sensing and metrology, remote sensing, ocean surface exploration, geophysical exploration, and acoustic microscopy.en_US
dc.language.isoEnglishen_US
dc.source.titleConference Record - IEEE Instrumentation and Measurement Technology Conferenceen_US
dc.relation.isversionofhttp://doi.org/10.1109/IMTC.1999.776981en_US
dc.subjectComputer visionen_US
dc.subjectCrosstalken_US
dc.subjectDistance measurementen_US
dc.subjectFeature extractionen_US
dc.subjectImage sensorsen_US
dc.subjectInterference suppressionen_US
dc.subjectLight reflectionen_US
dc.subjectSensor data fusionen_US
dc.subjectSpurious signal noiseen_US
dc.subjectMorphological surface profile extractionen_US
dc.subjectRange measurementen_US
dc.subjectSurface measurementen_US
dc.titleMap building with multiple range measurements using morphological surface profile extractionen_US
dc.typeArticleen_US
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.citation.spage825en_US
dc.citation.epage830en_US
dc.citation.volumeNumber2en_US
dc.identifier.doi10.1109/IMTC.1999.776981en_US
dc.publisherIEEE, Piscataway, NJ, United Statesen_US


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