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      XPS characterization of Bi and Mn collected on atom-trapping silica for AAS

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      Author
      Süzer, Şefik
      Ertas, N.
      Ataman, O. Y.
      Date
      1999
      Source Title
      Applied Spectroscopy
      Print ISSN
      0003-7028
      Publisher
      Sage Publications, Inc.
      Volume
      53
      Issue
      4
      Pages
      479 - 482
      Language
      English
      Type
      Article
      Item Usage Stats
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      Abstract
      The chemical state of analyte species collected on a water-cooled silica tube during atom-trapping atomic absorption spectrometric determination is investigated with the use of X-ray photoelectron spectroscopy (XPS) for Bi and Mn. Analysis of the Bi 4f7/2 peak reveals that the chemical state of Bi is +3 during initial trapping (before the atomization stage), but an additional 0-valence state of Bi is also observed after the atomization stage. With the use of the measured Mn 2p3/2 binding energy together with the observed 3s multiplet splitting, the chemical state of Mn is determined as +2 in all stages. Together with our previous determination of 0 valence for Au, it is now postulated that the stability of certain valence states of the three elements (Au, Bi, and Mn) on the silica matrix can be correlated to their electrochemical reduction potentials.
      Keywords
      Absorption spectroscopy
      Atomization
      Atoms
      Bismuth
      Electrochemistry
      Hole traps
      Manganese
      Reduction
      Silica
      Atom trapping
      Electrochemical reduction potentials
      Multiplet splitting
      Valence state determination
      X ray photoelectron spectroscopy
      Permalink
      http://hdl.handle.net/11693/25294
      Published Version (Please cite this version)
      https://doi.org/10.1366/0003702991946776
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