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dc.contributor.authorMallat, A.en_US
dc.contributor.authorGezici, Sinanen_US
dc.contributor.authorDardari, D.en_US
dc.contributor.authorVandendorpe, L.en_US
dc.date.accessioned2016-02-08T10:38:57Z
dc.date.available2016-02-08T10:38:57Z
dc.date.issued2014en_US
dc.identifier.issn1053-587X
dc.identifier.urihttp://hdl.handle.net/11693/25091
dc.description.abstractThreshold and ambiguity phenomena are studied in Part I of this paper where approximations for the mean-squared error (MSE) of the maximum-likelihood estimator are proposed using the method of interval estimation (MIE), and where approximate upper and lower bounds are derived. In this part, we consider time-of-arrival estimation and we employ the MIE to derive closed-form expressions of the begin-ambiguity, end-ambiguity and asymptotic signal-to-noise ratio (SNR) thresholds with respect to some features of the transmitted signal. Both baseband and passband pulses are considered. We prove that the begin-ambiguity threshold depends only on the shape of the envelope of the ACR, whereas the end-ambiguity and asymptotic thresholds only on the shape of the ACR. We exploit the results on the begin-ambiguity and asymptotic thresholds to optimize, with respect to the available SNR, the pulse that achieves the minimum attainable MSE. The results of this paper are valid for various estimation problems.en_US
dc.language.isoEnglishen_US
dc.source.titleIEEE Transactions on Signal Processingen_US
dc.relation.isversionofhttp://dx.doi.org/10.1109/TSP.2014.2355776en_US
dc.subjectMaximum likelihood estimatoren_US
dc.subjectMean-squared-erroren_US
dc.subjectOptimal signal designen_US
dc.subjectSignal-to-noise ratioen_US
dc.subjectThreshold and ambiguity phenomenaen_US
dc.subjectTime-of-arrivalen_US
dc.subjectMaximum likelihood estimatoren_US
dc.subjectMean-squared errorsen_US
dc.subjectNon-linear estimationen_US
dc.subjectOptimal signalsen_US
dc.titleStatistics of the MLE and approximate upper and lower bounds-part II: Threshold computation and optimal pulse design for TOA estimationen_US
dc.typeArticleen_US
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.citation.spage5677en_US
dc.citation.epage5689en_US
dc.citation.volumeNumber62en_US
dc.citation.issueNumber21en_US
dc.identifier.doi10.1109/TSP.2014.2355776en_US
dc.publisherInstitute of Electrical and Electronics Engineers Inc.en_US
dc.contributor.bilkentauthorGezici, Sinan


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