Show simple item record

dc.contributor.authorSandhu, A.en_US
dc.contributor.authorMasuda, H.en_US
dc.contributor.authorOral, A.en_US
dc.contributor.authorBending, S. J.en_US
dc.date.accessioned2016-02-08T10:35:21Z
dc.date.available2016-02-08T10:35:21Z
dc.date.issued2001en_US
dc.identifier.issn0021-4922
dc.identifier.urihttp://hdl.handle.net/11693/24856
dc.description.abstractAn ultra-high sensitive room temperature scanning Hall probe microscope (RT-SHPM) system incorporating a GaAs/A1GaAs micro-Hall probe was used for the direct magnetic imaging of localized magnetic field fluctuations in very close proximity to the surface of ferromagnetic materials. The active area, Hall coefficient and field sensitivity of the Hall probe were 0.8 μm×0.8 μm, 0.3 Ω/G and 0.04 G/√Hz, respectively. The use of a semiconducting Hall probe sensor enabled measurements in the presence of externally applied magnetic fields. Samples studied included magnetic recording media, demagnetized strontium ferrite permanent magnets, and low coercivity perpendicular garnet thin films. The RT-SHPM offers a simple means for quantitatively monitoring sub-micron magnetic domain structures at room temperature.en_US
dc.language.isoEnglishen_US
dc.source.titleJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papersen_US
dc.subjectGarnetsen_US
dc.subjectHall probe sensoren_US
dc.subjectMagnetic domainsen_US
dc.subjectMagnetic imagingen_US
dc.subjectMagnetic recording mediaen_US
dc.subjectScanning Hall probe microscopyen_US
dc.subjectFerromagnetic materialsen_US
dc.subjectFloppy disk storageen_US
dc.subjectGarnetsen_US
dc.subjectMagnetic bubblesen_US
dc.subjectMagnetic domainsen_US
dc.subjectMagnetic field effectsen_US
dc.subjectMagnetic hysteresisen_US
dc.subjectMagnetizationen_US
dc.subjectOptical microscopyen_US
dc.subjectScanningen_US
dc.subjectThin filmsen_US
dc.subjectMagnetic imagingen_US
dc.subjectScanning hall probe microscopes (SHPM)en_US
dc.subjectImaging techniquesen_US
dc.titleRoom temperature sub-micron magnetic imaging by scanning hall probe microscopyen_US
dc.typeArticleen_US
dc.departmentDepartment of Physicsen_US
dc.citation.spage4321en_US
dc.citation.epage4324en_US
dc.citation.volumeNumber40en_US
dc.citation.issueNumber6Ben_US
dc.publisherJapan Society of Applied Physicsen_US


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record