Bismuth nano-Hall probes fabricated by focused ion beam milling for direct magnetic imaging by room temperature scanning Hall probe microscopy
Bending, S. J.
The Institution of Engineering and Technology (IET)
1335 - 1336
Item Usage Stats
MetadataShow full item record
Bismuth nano-Hall probes fabricated by using focused ion beam (FIB) milling were studied. The nano-Hall probes were used for direct magnetic imaging of domain structures in low coercivity garnets and demagnetized strontium ferrite permanent magnets. The analysis was performed using room temperature scanning Hall probe microscopy and it was found that the Bi nano-probes could overcome limitations due to surface depletion and large series resistances.
Magnetic resonance imaging
Scanning electron microscopy
Focused ion beams (FIB)
Hall effect devices
Published Version (Please cite this version)http://dx.doi.org/10.1049/el:20010908
Showing items related by title, author, creator and subject.
Sandhu, A.; Masuda, H.; Oral, A.; Bending, S. J. (Japan Society of Applied Physics, 2001)An ultra-high sensitive room temperature scanning Hall probe microscope (RT-SHPM) system incorporating a GaAs/A1GaAs micro-Hall probe was used for the direct magnetic imaging of localized magnetic field fluctuations in ...
Bean-Livingston surface barriers for flux penetration in Bi 2Sr 2CaCu 2O 8+δ single crystals near the transition temperature Mihalache V.; Dede, M.; Oral, A.; Miu L. (2011)The first field for magnetic flux penetration H p in Bi 2Sr 2CaCu 2O 8+δ (Bi-2212) single crystals near the critical temperature T c was investigated from the local magnetic hysteresis loops registered for different magnetic ...
Hafalir, F. S.; Oran, O. F.; Gurler, N.; Ider, Y. Z. (Institute of Electrical and Electronics Engineers Inc., 2014)Images of electrical conductivity and permittivity of tissues may be used for diagnostic purposes as well as for estimating local specific absorption rate distributions. Magnetic resonance electrical properties tomography ...