Bismuth nano-Hall probes fabricated by focused ion beam milling for direct magnetic imaging by room temperature scanning Hall probe microscopy
Bending, S. J.
The Institution of Engineering and Technology (IET)
1335 - 1336
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Bismuth nano-Hall probes fabricated by using focused ion beam (FIB) milling were studied. The nano-Hall probes were used for direct magnetic imaging of domain structures in low coercivity garnets and demagnetized strontium ferrite permanent magnets. The analysis was performed using room temperature scanning Hall probe microscopy and it was found that the Bi nano-probes could overcome limitations due to surface depletion and large series resistances.
Magnetic resonance imaging
Scanning electron microscopy
Focused ion beams (FIB)
Hall effect devices
Published Version (Please cite this version)http://dx.doi.org/10.1049/el:20010908
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