Soft x-ray photoemission studies of Hf oxidation
Banaszak Holl, M. M.
Hamdan, N. M.
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
A I P Publishing LLC
106 - 109
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Charging of oxide films under x rays is an important issue that must be taken into consideration for determination of core-level binding energies as well as valence band offsets. Measurements are taken as a function of time, thickness, and annealing condition. Photoemission results show the presence of metallic Hf with the 4f7/2 binding energy of 18.16 eV, and at least one clear suboxide peak.
Polycrystalline hafnium foil
Soft x ray photoemission spectroscopy
Valence band offset