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      Temperature dependence of the phase of the response of YBCO edge-transition bolometers: effects of superconductivity transition and thermal parameters

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      Author(s)
      Fardmanesh, M.
      Askerzade, İ. N.
      Date
      2003
      Source Title
      Superconductor Science and Technology
      Print ISSN
      0953-2048
      Publisher
      Institute of Physics Publishing
      Volume
      16
      Issue
      1
      Pages
      28 - 32
      Language
      English
      Type
      Article
      Item Usage Stats
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      Abstract
      The variation of the phase of the response of YBCO edge-transition bolometers on crystalline MgO substrate is found to be dependent on the normal-superconducting transition. The phase of the response for T < Tc increased at low modulation frequencies where the thermal diffusion length into the sample substrate from the top absorbing YBCO film is longer than the substrate thickness. The substrate/cold-head boundary resistance mainly dominates the thermal conductance of our samples at low frequencies. This transition-dependent change of the phase of the response is interpreted to be due to the effects of the order parameter of the YBCO material on the phonon spectrum and hence the determining Kapitza boundary resistance. The phase of the response decreased at high modulation frequencies where the thermal diffusion length into the substrate is less than the substrate thickness. The results of our analytical model for the low modulation frequencies agree well with the measured values for temperatures close to the Tc-zero.
      Keywords
      Bolometers
      Crystalline materials
      Magnesia
      Phase transitions
      Substrates
      Superconducting films
      Superconducting transition temperature
      Thermal conductivity of solids
      Thermal diffusion in solids
      Yttrium barium copper oxides
      Edge-transition bolometers
      Kapitza boundary resistance
      High temperature superconductors
      Permalink
      http://hdl.handle.net/11693/24546
      Published Version (Please cite this version)
      http://dx.doi.org/10.1088/0953-2048/16/1/306
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      • Department of Electrical and Electronics Engineering 4011
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