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      Many-body effects in the Coulomb drag between low density electron layers

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      Author(s)
      Yurtsever, A.
      Moldoveanu, V.
      Tanatar, Bilal
      Date
      2003
      Source Title
      Solid State Communications
      Print ISSN
      0038-1098
      Publisher
      Elsevier Science
      Volume
      125
      Issue
      11-12
      Pages
      575 - 579
      Language
      English
      Type
      Article
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      Abstract
      Recent Coulomb drag experiments in low-density double-layer electron systems have the power of distinguishing various many-body formulations of the effective interactions. In this work we theoretically study the correlation effects on the drag resistivity in these systems within various models. The effective inter-layer interactions are best described by the generalization to the double-layer case of the Kukkonen-Overhauser approach which differs significantly from the self-consistent field approach of Singwi et al. [Phys. Rev. 176 (1968) 589]. Following the formulation of Vignale and Singwi [Phys. Rev. B 32 (1985) 2156] we derive an expression for the effective inter-layer interaction which embodies the many-body correlations through the local-field corrections. The drag resistivity is calculated within this approach together with the Hubbard approximation for the intra-layer local-field factor and a simple model for the inter-layer correlations. Comparison with the recent measurements of Kellogg et al. [Solid State Commun. 123 (2002) 515] yields very good agreement. Our results are also contrasted with the corresponding drag resistivities given by the Singwi et al. theory, the dynamic random-phase approximation and the Hubbard approximation. The significant differences found between these theories emphasize the strong sensitivity of the drag resistivity to the effective inter-layer interactions.
      Keywords
      A. Two-dimensional electron systems
      D. Drag resistivity
      D. Effective Coulomb interactions
      Approximation theory
      Correlation methods
      Electric conductivity
      Mathematical models
      Sensitivity analysis
      Inter-layer interactions
      Electrons
      Permalink
      http://hdl.handle.net/11693/24520
      Published Version (Please cite this version)
      http://dx.doi.org/10.1016/S0038-1098(03)00081-4
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