Position-invariant surface recognition and localization using infrared sensors
Date
2003Source Title
Optical Engineering
Print ISSN
0091-3286
Publisher
SPIE
Volume
42
Issue
12
Pages
3589 - 3594
Language
English
Type
ArticleItem Usage Stats
199
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219
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Abstract
Low-cost infrared emitters and detectors are used for the recognition of surfaces with different properties in a location-invariant manner. The intensity readings obtained with such devices are highly dependent on the location and properties of the surface in a way that cannot be represented in a simple manner, complicating the recognition and localization process. We propose the use of angular intensity scans and present an algorithm to process them. This approach can distinguish different surfaces independently of their positions. Once the surface is identified, its position can also be estimated. The method is verified experimentally with the surfaces aluminum, white painted wall, brown kraft paper, and polystyrene foam packaging material. A correct differentiation rate of 87% is achieved, and the surfaces are localized within absolute range and azimuth errors of 1.2 cm and 1.0 deg, respectively. The method demonstrated shows that simple infrared sensors, when coupled with appropriate processing, can be used to extract a significantly greater amount of information than they are commonly employed for. © 2003 Society of Photo-Optical Instrumentation Engineers.
Keywords
AlgorithmsAluminum
Feature extraction
Infrared detectors
Polystyrenes
Surfaces
Infrared emitters
Infrared sensors
Position estimation
Surface recognition
Optical sensors
Pattern recognition and feature extraction