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      BilKristal 4.0: A tool for crystal parameters extraction and defect quantification

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      Author(s)
      Okuyan, E.
      Okuyan, C.
      Date
      2015
      Source Title
      Computer Physics Communications
      Print ISSN
      104655
      Publisher
      Elsevier
      Volume
      195
      Pages
      214 - 215
      Language
      English
      Type
      Article
      Item Usage Stats
      264
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      Abstract
      In this paper, we present a revised version of BilKristal 3.0 tool. Raycast screenshot functionality is added to provide improved visual analysis. We added atomic distance analysis functionality to assess crystalline defects. We improved visualization capabilities by adding high level cut function definitions. Discovered bugs are fixed and small performance optimizations are made. © 2015 Elsevier B.V. All rights reserved.
      Keywords
      Basis vectors
      Chemistry
      Crystal
      Crystallography
      Material science
      Pattern recognition
      Primitive vectors
      Space group
      Symmetry
      Application programming interfaces (API)
      Atoms
      C++ (programming language)
      Chemistry
      Computer graphics
      Computer networks
      Computer operating systems
      Crystal atomic structure
      Crystal defects
      Crystal structure
      Crystallography
      Crystals
      Information analysis
      Information retrieval
      Molecular graphics
      Pattern recognition
      Personal computers
      Problem oriented languages
      Software testing
      Surface defects
      Vector spaces
      Vectors
      Visualization
      Volume rendering
      Windows operating system
      Basis vector
      Direct volume rendering
      Material science
      Performance optimizations
      Space Groups
      Statistical information
      Unstructured tetrahedral meshes
      View dependent visualization
      Crystal symmetry
      Permalink
      http://hdl.handle.net/11693/24325
      Published Version (Please cite this version)
      http://dx.doi.org/10.1016/j.cpc.2015.04.013
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      • Department of Computer Engineering 1561
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