BilKristal 4.0: A tool for crystal parameters extraction and defect quantification
Date
2015
Authors
Okuyan, E.
Okuyan, C.
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Abstract
In this paper, we present a revised version of BilKristal 3.0 tool. Raycast screenshot functionality is added to provide improved visual analysis. We added atomic distance analysis functionality to assess crystalline defects. We improved visualization capabilities by adding high level cut function definitions. Discovered bugs are fixed and small performance optimizations are made. © 2015 Elsevier B.V. All rights reserved.
Source Title
Computer Physics Communications
Publisher
Elsevier
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Keywords
Basis vectors, Chemistry, Crystal, Crystallography, Material science, Pattern recognition, Primitive vectors, Space group, Symmetry, Application programming interfaces (API), Atoms, C++ (programming language), Chemistry, Computer graphics, Computer networks, Computer operating systems, Crystal atomic structure, Crystal defects, Crystal structure, Crystallography, Crystals, Information analysis, Information retrieval, Molecular graphics, Pattern recognition, Personal computers, Problem oriented languages, Software testing, Surface defects, Vector spaces, Vectors, Visualization, Volume rendering, Windows operating system, Basis vector, Direct volume rendering, Material science, Performance optimizations, Space Groups, Statistical information, Unstructured tetrahedral meshes, View dependent visualization, Crystal symmetry
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Language
English