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      Resonant harmonic response in tapping-mode atomic force microscopy

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      Author(s)
      Sahin, O.
      Quate, C. F.
      Solgaard, O.
      Atalar, Abdullah
      Date
      2004
      Source Title
      Physical Review B (Condensed Matter)
       
      Physical Review B: covering condensed matter and materials physics
       
      Print ISSN
      2469-9950
      Electronic ISSN
      0163-1829
      Publisher
      American Physical Society
      Volume
      69
      Issue
      16
      Pages
      165416-1 - 165416-9
      Language
      English
      Type
      Article
      Item Usage Stats
      193
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      285
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      Abstract
      Higher harmonics in tapping-mode atomic force microscopy offers the potential for imaging and sensing material properties at the nanoscale. The signal level at a given harmonic of the fundamental mode can be enhanced if the cantilever is designed in such a way that the frequency of one of the higher harmonics of the fundamental mode (designated as the resonant harmonic) matches the resonant frequency of a higher-order flexural mode. Here we present an analytical approach that relates the amplitude and phase of the cantilever vibration at the frequency of the resonant harmonic to the elastic modulus of the sample. The resonant harmonic response is optimized for different samples with a proper design of the cantilever. It is found that resonant harmonics are sensitive to the stiffness of the material under investigation.
      Keywords
      Amplitude modulation
      Atomic force microscopy
      Imaging
      Mathematical analysis
      Nanoparticle
      Remote sensing
      Vibration
      Permalink
      http://hdl.handle.net/11693/24298
      Published Version (Please cite this version)
      http://dx.doi.org/10.1103/PhysRevB.69.165416
      Collections
      • Department of Electrical and Electronics Engineering 4011
      • Institute of Materials Science and Nanotechnology (UNAM) 2258
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