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dc.contributor.authorOnural, L.en_US
dc.date.accessioned2016-02-08T10:25:31Z
dc.date.available2016-02-08T10:25:31Z
dc.date.issued2004en_US
dc.identifier.issn0091-3286
dc.identifier.urihttp://hdl.handle.net/11693/24196
dc.description.abstractThe quadratic phase function is fundamental in describing and computing wave-propagation-related phenomena under the Fresnel approximation; it is also frequently used in many signal processing algorithms. This function has interesting properties and Fourier transform relations. For example, the Fourier transform of the sampled chirp is also a sampled chirp for some sampling rates. These properties are essential in interpreting the aliasing and its effects as a consequence of sampling of the quadratic phase function, and lead to interesting and efficient algorithms to simulate Fresnel diffraction. For example, it is possible to construct discrete Fourier transform (DFT)-based algorithms to compute exact continuous Fresnel diffraction patterns of continuous, not necessarily, periodic masks at some specific distances. © 2004 Society of Photo-Optical Instrumentation Engineers.en_US
dc.language.isoEnglishen_US
dc.source.titleOptical Engineeringen_US
dc.relation.isversionofhttp://dx.doi.org/10.1117/1.1802232en_US
dc.subjectChirpen_US
dc.subjectComputer-generated holographyen_US
dc.subjectDigital holographyen_US
dc.subjectDiscretizationen_US
dc.subjectFresnel diffractionen_US
dc.subjectQuadratic phase functionen_US
dc.subjectSamplingen_US
dc.subjectAlgorithmsen_US
dc.subjectApproximation theoryen_US
dc.subjectComputer generated holographyen_US
dc.subjectComputer simulationen_US
dc.subjectDiscrete Fourier transformsen_US
dc.subjectFunctionsen_US
dc.subjectLight propagationen_US
dc.subjectChirpen_US
dc.subjectDiffraction simulationen_US
dc.subjectDigital holographyen_US
dc.subjectFresnel diffractionen_US
dc.subjectQuadratic phase functionen_US
dc.subjectDiffractionen_US
dc.titleSome mathematical properties of the uniformly sampled quadratic phase function and associated issues in digital Fresnel diffraction simulationsen_US
dc.typeArticleen_US
dc.departmentDepartment of Electrical and Electronics Engineering
dc.citation.spage2557en_US
dc.citation.epage2563en_US
dc.citation.volumeNumber43en_US
dc.citation.issueNumber11en_US
dc.identifier.doi10.1117/1.1802232en_US
dc.publisherSPIE - International Society for Optical Engineeringen_US


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