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dc.contributor.authorBoriskin, A. V.en_US
dc.contributor.authorNosich, A. I.en_US
dc.contributor.authorBoriskina, S. V.en_US
dc.contributor.authorBenson, T. M.en_US
dc.contributor.authorSewell, P.en_US
dc.contributor.authorAltintas, A.en_US
dc.date.accessioned2016-02-08T10:24:47Z
dc.date.available2016-02-08T10:24:47Z
dc.date.issued2004en_US
dc.identifier.issn0895-2477
dc.identifier.urihttp://hdl.handle.net/11693/24149
dc.description.abstractThe behavior of a 2D model of an extended hemielliptic silicon lens of a size typical for THz applications is accurately studied for the case of a plane E-wave illumination. The full-wave analysis of the scattering problem is based on the Mutter's boundary integral-equations (MB1E) that are uniquely solvable. A Calerkin discretization scheme with a trigonometric basis leads tu a very efficient numerical algorithm. The numerical results related to the focusability of the lens versus its rear-side extension and the angle of the plane-wave incidence, as well as near-field profiles, demonstrate strong resonances. Such effects can change the principles of optimal design of lens-based receivers.en_US
dc.language.isoEnglishen_US
dc.source.titleMicrowave and Optical Technology Lettersen_US
dc.relation.isversionofhttp://dx.doi.org/10.1002/mop.20520en_US
dc.subjectBoundary integral equationsen_US
dc.subjectDielectric lensen_US
dc.subjectFocusabilityen_US
dc.subjectAlgorithmsen_US
dc.subjectComputer simulationen_US
dc.subjectDielectric amplifiersen_US
dc.subjectElectromagnetic wavesen_US
dc.subjectError analysisen_US
dc.subjectFourier transformsen_US
dc.subjectGeometrical opticsen_US
dc.subjectGreen's functionen_US
dc.subjectIntegral equationsen_US
dc.subjectMathematical modelsen_US
dc.titleLens or resonator? Electromagnetic behavior of an extended hemielliptic lens for a sub-millimeter-wave receiveren_US
dc.typeArticleen_US
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.citation.spage515en_US
dc.citation.epage518en_US
dc.citation.volumeNumber43en_US
dc.citation.issueNumber6en_US
dc.identifier.doi10.1002/mop.20520en_US
dc.publisherJohn Wiley & Sonsen_US
dc.identifier.eissn1098-2760


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