Energy relaxation of electrons in InGaN quantum wells
Author(s)
Date
2015-04Source Title
Metallurgical and Materials Transactions A - Physical Metallurgy and Materials Science
Print ISSN
1073-5623
Publisher
Springer New York LLC
Volume
46
Issue
4
Pages
1565 - 1569
Language
English
Type
ArticleItem Usage Stats
241
views
views
230
downloads
downloads
Abstract
In this study, electron energy relaxation mechanisms in HEMT structures with different InxGa1−xN-channel quantum well (QW) widths are investigated. Theoretical value of the inelastic scattering rates is carried out at electron temperatures between 30 K (−243 °C) < Te < 700 K (427 °C). We used both the experimentally determined and calculated electron temperatures to estimate the energy relaxation rates of non-equilibrium electrons. In wide InGaN QWs, power loss of an electron is shown to be significantly smaller than that in the narrower QWs. © 2015, The Minerals, Metals & Materials Society and ASM International.
Keywords
Electron energy levelsElectrons
High electron mobility transistors
Inelastic scattering
Semiconducting indium compounds
Semiconductor quantum wells
Electron energies
Energy relaxation
Inelastic scattering rate
InGaN quantum wells
N-channel
Non-equilibrium electrons
Power-losses
Theoretical values
Electron temperature
Permalink
http://hdl.handle.net/11693/24148Published Version (Please cite this version)
http://dx.doi.org/10.1007/s11661-015-2762-2Collections
Related items
Showing items related by title, author, creator and subject.
-
Dynamical screening effects in hot-electron scattering from electron-hole plasma and LO-phonon modes in quantum wires
Bennett, C. R.; Tanatar, Bilal; Constantinou, N. C. (Elsevier, 1996)We present a fully dynamical and finite temperature study of the hot-electron momentum relaxation rate and the power loss in a coupled system of electron-hole plasma and bulk LO-phonons in a quantum wire structure. ... -
Imaging capability of pseudomorphic high electron mobility transistors, AlGaN/GaN, and Si micro-Hall probes for scanning Hall probe microscopy between 25 and 125 °c
Akram, R.; Dede, M.; Oral, A. (American Vacuum Society, 2009)The authors present a comparative study on imaging capabilities of three different micro-Hall probe sensors fabricated from narrow and wide band gap semiconductors for scanning hall probe microscopy at variable temperatures. ... -
Simultaneous photoinduced electron transfer and photoinduced CuAAC processes for antibacterial thermosets
Oz, E.; Uyar, T.; Esen, H.; Tasdelen, M. A. (Elsevier, 2017)A combination of simultaneous photoinduced electron transfer and photoinduced CuAAC processes enables the in-situ preparation of antibacterial thermosets containing silver nanoparticles (AgNPs) in one-pot. Upon photolysis ...