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dc.contributor.authorMoussa, R.en_US
dc.contributor.authorFoteinopoulou, S.en_US
dc.contributor.authorZhang, L.en_US
dc.contributor.authorTuttle, G.en_US
dc.contributor.authorGuven, K.en_US
dc.contributor.authorÖzbay, Ekmelen_US
dc.contributor.authorSoukoulis, C. M.en_US
dc.date.accessioned2016-02-08T10:24:25Z
dc.date.available2016-02-08T10:24:25Z
dc.date.issued2005en_US
dc.identifier.issn2469-9950
dc.identifier.urihttp://hdl.handle.net/11693/24121
dc.description.abstractWe experimentally and theoretically studied a left-handed structure based on a photonic crystal (PC) with a negative refractive index. The structure consists of triangular array of rectangular dielectric bars with dielectric constant 9.61. Experimental and theoretical results demonstrate the negative refraction and the superlensing phenomena in the microwave regime. The results show high transmission for our structure for a wide range of incident angles. Furthermore, surface termination within a specific cut of the structure excite surface waves at the interface between air and PC and allow the reconstruction of evanescent waves for a better focus and better transmission. The normalized average field intensity calculated in both the source and image planes shows almost the same full width at half maximum for the source and the focused beam.en_US
dc.language.isoEnglishen_US
dc.source.titlePhysical Review B: Covering Condensed Matter and Materials Physicsen_US
dc.relation.isversionofhttp://dx.doi.org/10.1103/PhysRevB.71.085106en_US
dc.subjectCrystalen_US
dc.subjectCrystal structureen_US
dc.subjectExperimenten_US
dc.subjectImaging systemen_US
dc.subjectLensen_US
dc.subjectPhotonen_US
dc.subjectRefraction indexen_US
dc.subjectTheoryen_US
dc.titleNegative refraction and superlens behavior in a two-dimensional photonic crystalen_US
dc.typeArticleen_US
dc.departmentDepartment of Physicsen_US
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.departmentNanotechnology Research Center (NANOTAM)en_US
dc.departmentInstitute of Materials Science and Nanotechnology (UNAM)en_US
dc.citation.spage085106-1en_US
dc.citation.epage085106-5en_US
dc.citation.volumeNumber71en_US
dc.citation.issueNumber8en_US
dc.identifier.doi10.1103/PhysRevB.71.085106en_US
dc.publisherAmerican Physical Societyen_US
dc.contributor.bilkentauthorÖzbay, Ekmel


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