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dc.contributor.authorAytaç, T.en_US
dc.contributor.authorBarshan, B.en_US
dc.date.accessioned2016-02-08T10:23:19Z
dc.date.available2016-02-08T10:23:19Z
dc.date.issued2005en_US
dc.identifier.issn0091-3286
dc.identifier.urihttp://hdl.handle.net/11693/24049
dc.description.abstractWe differentiate surfaces with different properties with simple low-cost IR emitters and detectors in a location-invariant manner. The intensity readings obtained with such sensors are highly dependent on the location and properties of the surface, which complicates the differentiation and localization process. Our approach, which models IR intensity scans parametrically, can distinguish different surfaces independent of their positions. Once the surface type is identified, its position (r, θ) can also be estimated. The method is verified experimentally with wood; Styrofoam packaging material; white painted matte wall; white and black cloth; and white, brown, and violet paper. A correct differentiation rate of 100% is achieved for six surfaces, and the surfaces are localized within absolute range and azimuth errors of 0.2 cm and 1.1 deg, respectively. The differentiation rate decreases to 86% for seven surfaces and to 73% for eight surfaces. The method demonstrated shows that simple IR sensors, when coupled with appropriate signal processing, can be used to recognize different types of surfaces in a location-invariant manner.en_US
dc.language.isoEnglishen_US
dc.source.titleOptical Engineeringen_US
dc.relation.isversionofhttps://doi.org/10.1117/1.1931467en_US
dc.subjectSurface differentiationen_US
dc.subjectInfrared sensorsen_US
dc.subjectPosition estimationen_US
dc.subjectLambertian reflectionen_US
dc.subjectPhong modelen_US
dc.subjectPattern recognitionen_US
dc.subjectFeature extractionen_US
dc.subjectOptical sensingen_US
dc.titleSurface differentiation by parametric modeling of infrared intensity scansen_US
dc.typeArticleen_US
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.citation.spage067202 (1-9)en_US
dc.citation.volumeNumber44en_US
dc.citation.issueNumber6en_US
dc.identifier.doi10.1117/1.1931467en_US
dc.publisherSPIE-International Society for Optical Engineeringen_US
dc.identifier.eissn1560-2303


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