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      • Department of Electrical and Electronics Engineering
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      Superconductivity transition dependence of the thermal crosstalk in YBa 2Cu 3O 7-x edge-transition bolometer arrays

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      Author(s)
      Bozbey, A.
      Fardmanesh, M.
      Schubert, J.
      Banzet, M.
      Date
      2006
      Source Title
      IEEE Transactions on Applied Superconductivity
      Print ISSN
      1051-8223
      Electronic ISSN
      1558-2515
      Publisher
      Institute of Electrical and Electronics Engineers
      Volume
      16
      Issue
      1
      Pages
      9 - 14
      Language
      English
      Type
      Article
      Item Usage Stats
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      Abstract
      The effect of the superconductivity transition on the thermal crosstalk in YBa 2Cu 3O 7-x, edge-transition bolometer arrays is investigated for DC to midrange modulation frequency infrared radiation. The bolometers in the arrays were designed with various distances on SrTiO 3 (100) substrates. We have observed a change in the thermal crosstalk between neighbor devices through the superconductivity transition temperature range. Superconductivity transition dependence of the thermal coupling between the devices was measured by utilizing the thermal conductance measurement methods developed for the bulk material. The knee points in the magnitude of the response versus modulation frequency curves of the devices were also determined by illuminating one of the bolometers in the arrays and measuring the response of the neighbor devices. By using the knee frequency and the distance between the bolometers, the modulation frequency criterion for crosstalk-free response at the transition region in various array structures is found and the results of the thermal coupling measurements are further studied and presented here.
      Keywords
      Bolometer array
      Infrared detector
      Superconductivity
      Thermal conductivity
      Thermal crosstalk
      Permalink
      http://hdl.handle.net/11693/23837
      Published Version (Please cite this version)
      https://doi.org/10.1109/TASC.2005.861040
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      • Department of Electrical and Electronics Engineering 4011
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