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      Observation of negative refraction and focusing in two-dimensional photonic crystals

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      Author(s)
      Özbay, Ekmel
      Bulu, M.
      Guven, K.
      Caglayan, H.
      Aydin, K.
      Date
      2006
      Source Title
      Reviewed Japanese Journal of Applied Physics
      Print ISSN
      0021-4922
      Publisher
      Institute of Physics Publishing Ltd.
      Volume
      45
      Issue
      8 A
      Pages
      6064 - 6070
      Language
      English
      Type
      Article
      Item Usage Stats
      259
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      209
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      Abstract
      We experimentally and theoretically demonstrate the negative refraction and focusing of electromagnetic (EM) waves by twodimensional photonic crystal slabs at microwave frequencies. The negative refraction is observed both for transverse magnetic (TM) and transverse electric (TE) polarized incident EM waves. Gaussian beam shifting method is used to verify the negative refractive index. The Subwavelength imaging and flat lens behavior of photonic crystals are succesfully demonstrated. We have been able to overcome the diffraction limit and focus the EM waves to a spot size of 0.21λ. Metallodielectric photonic crystals are employed to increase the range of angle of incidence that results in negative refraction. Experimental results and theoretical calculations are in good agreement throughout the work. © 2006 The Japan Society of Applied Physics.
      Keywords
      Band diagram
      Equal frequency contours
      Flat lens
      Left-handed materials
      Metamaterial
      Negative refraction
      Photonic band gap
      Photonic crystals
      Subwavelength imaging
      Electromagnetic waves
      Imaging techniques
      Photons
      Refraction
      Refractive index
      Band diagram
      Equal frequency contours
      Flat lens
      Left handed materials
      Metamaterials
      Negative refraction
      Photonic band gap
      Photonic crystals
      Subwavelength imaging
      Crystal structure
      Permalink
      http://hdl.handle.net/11693/23742
      Published Version (Please cite this version)
      http://dx.doi.org/10.1143/JJAP.45.6064
      Collections
      • Department of Electrical and Electronics Engineering 3868
      • Department of Physics 2485
      • Nanotechnology Research Center (NANOTAM) 1125
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