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dc.contributor.authorSezen, H.en_US
dc.contributor.authorErtas, G.en_US
dc.contributor.authorDâna, A.en_US
dc.contributor.authorSüzer, Şefiken_US
dc.date.accessioned2016-02-08T10:13:59Z
dc.date.available2016-02-08T10:13:59Z
dc.date.issued2007en_US
dc.identifier.issn0024-9297
dc.identifier.urihttp://hdl.handle.net/11693/23441
dc.description.abstractPolystyrene / polymethyl methacrylate (PS-PMMA) thin films were analyzed for detecting phase separation as well as probing their electrical responses by XPS. It was also shown that electrical parameters like resistance or capacitance can also be extracted using dynamical XPS measurements. A Kratos ES300 electron spectrometer was used for XPS measurements, and a nearby filament provided low-energy electrons for charge neutralization. The results show that under a positive stress, low-energy electrons are attracted to the sample and yield less positive charge on the sample, due to partial neutralization.en_US
dc.language.isoEnglishen_US
dc.source.titleMacromoleculesen_US
dc.relation.isversionofhttp://dx.doi.org/10.1021/ma070537yen_US
dc.subjectElectric dischargesen_US
dc.subjectElectric propertiesen_US
dc.subjectElectronsen_US
dc.subjectMeasurement theoryen_US
dc.subjectPhase separationen_US
dc.subjectPolystyrenesen_US
dc.subjectThin filmsen_US
dc.subjectX ray photoelectron spectroscopyen_US
dc.subjectElectrical parametersen_US
dc.subjectElectron spectrometersen_US
dc.subjectPartial neutralizationen_US
dc.subjectPolymethyl methacrylatesen_US
dc.titleCharging / discharging of thin PS / PMMA films as probed by dynamic x-ray photoelectron spectroscopyen_US
dc.typeArticleen_US
dc.departmentDepartment of Chemistryen_US
dc.departmentDepartment of Physicsen_US
dc.citation.spage4109en_US
dc.citation.epage4112en_US
dc.citation.volumeNumber40en_US
dc.citation.issueNumber12en_US
dc.identifier.doi10.1021/ma070537yen_US
dc.contributor.bilkentauthorSüzer, Şefik


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