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      Charging / discharging of thin PS / PMMA films as probed by dynamic x-ray photoelectron spectroscopy

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      Author
      Sezen, H.
      Ertas, G.
      Dâna, A.
      Süzer, Şefik
      Date
      2007
      Source Title
      Macromolecules
      Print ISSN
      0024-9297
      Volume
      40
      Issue
      12
      Pages
      4109 - 4112
      Language
      English
      Type
      Article
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      Abstract
      Polystyrene / polymethyl methacrylate (PS-PMMA) thin films were analyzed for detecting phase separation as well as probing their electrical responses by XPS. It was also shown that electrical parameters like resistance or capacitance can also be extracted using dynamical XPS measurements. A Kratos ES300 electron spectrometer was used for XPS measurements, and a nearby filament provided low-energy electrons for charge neutralization. The results show that under a positive stress, low-energy electrons are attracted to the sample and yield less positive charge on the sample, due to partial neutralization.
      Keywords
      Electric discharges
      Electric properties
      Electrons
      Measurement theory
      Phase separation
      Polystyrenes
      Thin films
      X ray photoelectron spectroscopy
      Electrical parameters
      Electron spectrometers
      Partial neutralization
      Polymethyl methacrylates
      Permalink
      http://hdl.handle.net/11693/23441
      Published Version (Please cite this version)
      http://dx.doi.org/10.1021/ma070537y
      Collections
      • Department of Chemistry 594
      • Department of Physics 2299
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