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      • Department of Mechanical Engineering
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      Inertial imaging with nanomechanical systems

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      Author(s)
      Hanay, M. S.
      Kelber, S. I.
      O'Connell, C. D.
      Mulvaney, P.
      Sader, J. E.
      Roukes, M. L.
      Date
      2015
      Source Title
      Nature Nanotechnology
      Print ISSN
      1748-3387
      Publisher
      Nature Publishing Group
      Volume
      10
      Issue
      4
      Pages
      339 - 344
      Type
      Article
      Item Usage Stats
      230
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      320
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      Abstract
      Mass sensing with nanoelectromechanical systems has advanced significantly during the last decade. With nanoelectromechanical systems sensors it is now possible to carry out ultrasensitive detection of gaseous analytes, to achieve atomic-scale mass resolution and to perform mass spectrometry on single proteins. Here, we demonstrate that the spatial distribution of mass within an individual analyte can be imaged - in real time and at the molecular scale - when it adsorbs onto a nanomechanical resonator. Each single-molecule adsorption event induces discrete, time-correlated perturbations to all modal frequencies of the device. We show that by continuously monitoring a multiplicity of vibrational modes, the spatial moments of mass distribution can be deduced for individual analytes, one-by-one, as they adsorb. We validate this method for inertial imaging, using both experimental measurements of multimode frequency shifts and numerical simulations, to analyse the inertial mass, position of adsorption and the size and shape of individual analytes. Unlike conventional imaging, the minimum analyte size detectable through nanomechanical inertial imaging is not limited by wavelength-dependent diffraction phenomena. Instead, frequency fluctuation processes determine the ultimate attainable resolution. Advanced nanoelectromechanical devices appear capable of resolving molecular-scale analytes.
      Keywords
      Gold nanoparticle
      Single walled nanotube
      Adsorption
      Atomic force microscopy
      Diffraction
      Error
      Image processing
      Image reconstruction
      Inertial imaging
      Mass
      Mass spectrometry
      Measurement
      Nanoelectromechanical system
      Nanotechnology
      Priority journal
      Scanning electron microscopy
      Signal noise ratio
      Simulation
      Permalink
      http://hdl.handle.net/11693/23370
      Published Version (Please cite this version)
      http://dx.doi.org/10.1038/nnano.2015.32
      Collections
      • Department of Mechanical Engineering 374
      • Institute of Materials Science and Nanotechnology (UNAM) 2260
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